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Alternative NSN: 5961-00-494-4913 |
Item Name:Semiconductor Device Diode |
FSG: 59 Electrical and Electronic Equipment Components |
Federal Supply Class (FSC): 5961 Semiconductor Devices and Associated Hardware |
NIIN: 004944913 |
NCB Code: USA (00) |
Manufacturers: Adelco Elektronik Gmbh , Astronautics Corporation Of America , Bae Systems Information And Electronic Systems Integration I , Boeing Company The , Control Data Systems Inc , Diodes Inc , Dynalec Corporation , Edo Corp , General Electric Company , Hamilton Sundstrand Corporation , Hughes Corporation , Inspektorat Wsparcia Sil Zbrojnych , International Rectifier Corporation , L 3 Communications Corporation , Raytheon Company , Rockwell Collins Inc , Semicon Components Inc , Shugart Corp , Sundstrand International Corporation , Syntegra Usa Inc |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | METAL |
ABHP | OVERALL LENGTH | 0.405 INCHES MAXIMUM |
AKPV | MOUNTING FACILITY QUANTITY | 1 |
AXGY | MOUNTING METHOD | THREADED STUD |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CCDG | OVERALL WIDTH ACROSS FLATS | 0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM |
CQJX | NOMINAL THREAD SIZE | 0.190 INCHES |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE, MAXIMUM PEAK TOTAL VALUE |
CTQX | CURRENT RATING PER CHARACTERISTIC | 240.00 AMPERES SOURCE CUTOFF CURRENT PRESET |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS CASE |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI |
THSD | THREAD SERIES DESIGNATOR | UNF |
TTQY | TERMINAL TYPE AND QUANTITY | 1 TAB, SOLDER LUG AND 1 THREADED STUD |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/260 GOVERNMENT SPECIFICATION |
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